Ultra-Short Silicon Nitride Cantilevers
Ultra-Short Silicon Nitride Cantilevers are available on demand as NANOSENSORS™ Special Development item. Ultra-Short Silicon Nitride Cantilevers for High-Speed AFM (HS-AFM) combine very small AFM cantilevers made of silicon nitride which are designed for resonating at frequencies of up to 6 MHz and a very sharp and wear resistant High Density Carbon / Diamond Like Carbon (HDC / DLC) AFM tip.
• especially designed for high speed scanning applications
• cannot be used in all commercial SPMs and AFMs due to the small dimensions of the AFM cantilevers
• AFM cantilever and AFM tip are supported by a single crystal silicon support chip
• no intrinsic stress and absolutely straight AFM cantilevers
AFM Cantilever• rectangular AFM cantilever with rounded corners at the freestanding end
• AFM cantilever made of silicon nitride
Support Chip• dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
• etched and lowered corners of the support chip avoid contact between the support chip and the sample
AFM Tip •
nanotools® High Density Carbon / Diamond Like Carbon (HDC / DLC) AFM tip
• AFM tip height typically 2.5 μm and radius of curvature typically < 10 nm
• AFM tip aspect ratio typically 5:1 and tilt compensation of 8°
Gold Reflex Coating • 30/70 nm thick gold reflex coating on the detector side of the AFM cantilever
• enhances reflectance of the laser beam
Different types of Ultra-Short Silicon Nitride Cantilevers have been fabricated:
Type | SD-USC-SiN-6MHz | SD-USC-SiN-3MHz | SD-USC-SiN-1.2MHz |
Resonance Frequency |
6.0 MHz |
3.0 MHz |
1.2 MHz |
Force Constant |
45 N/m |
0.9 N/m |
0.4 N/m |
Cantilever length |
9.5 µm |
4.2 µm |
6.8 µm |
Cantilever width |
4.5 µm |
2.3 µm |
4.5 µm |
Cantilever thickness |
0.50 µm |
0.06 µm |
0.06 µm |
NANOSENSORS™ is a trademark of NanoWorld AG.
USC-SiN Support Chip
3D View
USC-SiN AFM Cantilever
3D View
USC-SiN AFM Cantilever
3D View
USC-SiN AFM Cantilever (thin)
Side View
USC-SiN AFM Cantilever (thick)
Side View